Abstract: The era of artificial neural network (ANN) began with a simplified application in many fields and remarkable success in pattern recognition (PR) even in manufacturing industries. Although ...
Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.
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The camouflage you're seeing everywhere
Camouflage once meant blotchy green uniforms in the woods. Now it shows up on parkas and baby carriers. In Wired, Avery ...
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